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In – depth chemical and optoelectronic analysis of triple-cation perovskite thin films by combining XPS profiling and PL Imaging

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https://hal.uvsq.fr/hal-03683422
Contributor : Muriel BOUTTEMY Connect in order to contact the contributor
Submitted on : Tuesday, May 31, 2022 - 4:03:55 PM
Last modification on : Friday, June 10, 2022 - 3:16:38 AM

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Stefania Cacovich, Pia Dally, Guillaume Vidon, Marie Legrand, Stéphanie Gbegnon, et al.. In – depth chemical and optoelectronic analysis of triple-cation perovskite thin films by combining XPS profiling and PL Imaging. ACS Applied Materials & Interfaces, Washington, D.C. : American Chemical Society, 2021, pp.acsami.1c22286. ⟨10.1021/acsami.1c22286⟩. ⟨hal-03683422⟩

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